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ANSI
American National Standards Institute
FEA
Finite-Element Analysis
OSP
Organic Solder Preservative
AOI
Automated Optical Inspection
FEM
Finite-Element Modeling
PB
Printed Board
ASCII
American Standard Code For Information Interchange
FEP
Fluorinated Ethylene-Propylene (Teflon)
PBA
Printed Board Assembly
ASIC
Application Specific Integrated Circuit
FET
Field-Effect Transistor
PBX
Private Branch Exchange
ATE
Automatic Test Equipment
FFT
Fast Fourier Transform
PCA
Printed Circuit Assembly 
AWG
American Wire Gauge
FMEA
Fault Mode And Effect Analysis
PCA
Printed Circuit Assembly
AXI
Automated X-Ray Inspection
FPGA
Field Programmable Gate Array
PCB
Printed Circuit Board
BGA
Ball Grid Array
FPT
Fine-Pitch Technology
PCBA
Printed Circuit Board Assembly 
BOM
Bill Of Material
FTP
File Transfer Protocol
PCMCIA
Personal Computer Memory Card International Association
CAD
Computer-Aided Design
GBIB
General Purpose Interface Bus
PDH
Plesiochronous Digital Hierarchy
CADD
Computer-Aided Design and Drafting
HASL
Hot Air Solder Levelling
PDM
Product Data Management 
CAE
Computer-Aided Engeneering
HDI
High Density Interconnect
PIP
Pin-In-Paste Technology
CALS
Computer-aided Acquisition and Logistic Support(DOD)
HPGL
Hewlett Packard Graphic Language
PLCC
Plastic Leaded Chip Carrier
CAM
Computer-Aided Manufacturing
HTE
High Temperature Elongation
PLM
Product Lifecycle Management
CASE
Computer-Aided Software Engineering
HTML
HyperText Markup Language
PPM
Parts Per Million
CAT
Computer-Aided Testing
HTTP
HyperText Transfer Protocol
PSI
Pounds Per Square Inch
CBGA
Ceramic Ball Grid Array
IC
Integrated Circuit
PTFE
Polytetrafluoroethylene (Teflon)
CIM
Computer-Integrated Manufacturing
ICAM
Integrated Computer-Aided Manufacturing
PTH
Plated Through-Hole
CM
Contract Manufacturer
ICT
In-Circuit Test
PWB
Printed Wiring Board
CMOS
Complimentary Metal-Oxide Semiconductor
IEC
International Electrotechnical Commission
PVC
Polyvinyl Chloride
CNC
Computer Numerical Control
IECQ
International Electronic Component Qualification system
QML
Qualified Manufacturers List
COB
Chip-on-Board
IEDR
Initial Engineering Design Review
QPL
Qualified Products List
CPLD
Complex Programmable Logic Device
IEEE
Institute Of Electrical And Electronic Engineers
QTA
Quick Turn Around
CPU
Central Processing Unit
IEPS
International Electronic Packaging Society
R&R
Repeatability And Reproducibility
CRC
Cyclic Redundancy Check
IGES
Integrated Graphics Exchange System
RAM
Random Access Memory
CRT
Cathode-Ray Tube
ILB
Inner-Lead Bonding (Tab)
RETMA
Radio Electronics & Television Manufacturers Association
CSP
Chip Scale Package
IP
Internet Protocol
RF
Radio Frequency
CTE
Coefficient Of Thermal Expansion
IPC 
Institute for Printed Circuits
RFI
Radio-Frequency Interference
DBMS
DataBase Management System
IR
InfraRed
RISC
Reduced Instruction Set Computing
DFM
Design For Manufacturability
ISO
International Organization For Standardization
RMS
Root Mean Square
DFSM
Dry Film Solder Mask
JEDEC
Solid State Technology Association (Formerly The Joint Electronic Device Engineering Council)
ROM
Read Only Memory
DFT
Design For Testability
JIT
Just-In-Time (Manufacturing)
SAE
Society Of Automotive Engineers
DIN
Deutsches Institut für Normung
KGB
Known Good Board
SDH
Synchronous Digital Hierarchy
DIP
Dual In-line Package
KGD
Known Good Die
SMD
Surface Mounted Device
DMA
Direct Memory Access
LAN
Local Area Network
SMOBC
Solder Mask Over Bare Copper
DOD
Department Of Defense
LBA
Logical Block Address
SMT
Surface Mount Technology
DOS
Disc Operating System
LCCC
Leadless Ceramic Chip Carrier
SOIC
Small Outline Integrated Circuit
DRC
Design Rule Checking
LCD
Liquid Crystal Display
SPICE
Simulation Program, Integrated Circuit Emphasis
DSP
Digital Signal Processor
LDA
Logic Design Automation
SQC
Statistical Quality Control
DXF
Data eXchange Format
LED
Light-Emitting Diode
SQL
Structured Query Language
ECAD
Electronic Computer-Aided Design
LIF
Low Insertion Force
STEP
Standard For Exchange Of Product Model Data
ECL
Emitter-Coupled Logic
MCAD
Mechanical Computer-Aided Design
TAB
Tape-Automated Bonding
ECN
Engineering Change Notice
MCAE
Mechanical Computer-Aided Engineering
TCP/IP
Transmission Control Protocol / Internet Protocol
ECO
Engineering Change Order
MCM
Multichip Module
TFE
Tetrafluoroethylene (Teflon)
ECR
Engineering Change Request
MELF
Metal Electrode Face (Discrete Leadless Component)
THT
Through-Hole Technology
EDA
Electronic Design Automation
MLB
MultiLayer Board
TIFF
Tagged Image File Format
EDI
Electronic Data Interchange
MOS
Metal-Oxide Semiconductor
TO
Transistor Outline
EDIF
Electronic Design Interchange Format
MRP
Material Requirement Planning
TQM
Total Quality Management
EIA
Electronics Industry Association
MTBF
Mean Time Between Failures
T's & C's
Terms And Conditions
EIS
Engineering Information System
MTTR
Mean Time To Repair
TTL
Transistor-Transistor Logic
EMC
Electro-Magnetic Compatibility
NASA
National Aeronautics And Space Administration
UHF
Ultra-High Frequency
EMF
Electro-Motive Force
NBS
National Bureau Of Standards
UL
Underwriter’s Laboratories
EMI
Electro-Magnetic Interference
NC
Numerical Control
URL
Uniform Resource Locator
EMP
Electro-Magnetic Pulse
NDT
Non-Destructive Testing
VHDL
Vhsic Hardware Description Language
EMS
Electrical Manufacturing Services
NECQ
National Electronics Component Qualification System
VHF
Very-High Frequency
ENIG
Electroless Nickel with Immersion Gold coating 
NEMA
National Electrtical Manufacturers Association
VHSIC
Very-High Speed Integrated Circuits
ESD
Electro-Static Discharge
NPI
New Product Introduction
VME
Versa-Module Electronic
ESR
Equivalent Series Resistance
NPTH
Non-Plated Through-Hole
WYSIWYG
What You See Is What You Get
FAR
Failure Analysis Report
OEM
Original Equipment Manufacturer
ZAF
Z-Axis Adhesive Film
FCC
Federal Communications Commission
OFHC
Oxygen-Free High-Conductivity Copper
ZIF
Zero-Insertion Force
FC-CBGA
Flip Chip Ceramic Ball Grid Array
OLB
Outer-Lead Bonding (Tab)
 
 
FCT
Functional Circuit Test
OSI
Open Systems Interconnection
 
 

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Senast uppdaterad: 2012-09-16